ICSPI, a leader in benchtop nanoscale imaging instruments, announces the launch of its new Redux AFM, an automated atomic force microscope (AFM) designed to allow scientists and engineers to effortlessly collect 3-dimensional data at the nanoscale.
ICSPI Launches the Redux AFM to make Nanoscale Imaging More Accessible than Ever Read More »
The capacitance electronic disc (CED) is a nanoscale marvel. Learn about how this relic of consumer technology works.
What is a capacitance electronic disc (CED)? Read More »
The short answer is: yes! AFM is the go-to technique for collecting 3D surface data at the nanoscale.
Can AFM measure 3D data? Read More »
We discuss why AFM is a powerful technique and often the tool of choice for surface roughness measurements.
Can AFM Measure Surface Roughness? Read More »
An SEM is used to pattern nanoscale features on resist using e-beam lithography. The nGauge AFM is used to measure them!
AFM for E-beam Lithography Read More »
The popular YouTube material science channel Breaking Taps builds a “macro AFM” and does live scanning using the nGauge AFM!
What is AFM? Featuring the nGauge AFM on Breaking Taps Read More »
News ICSPI Hosts Nanoscience Delegation from Brazil and India June 9, 2022 Delegation for the Waterloo Institute of Nanotechnology. From left, Prof. Monica Cotta, Prof. Ajay K. Sood, David Morris from ICSPI, Oleg Stukalov from WIN Waterloo, June 9, 2022 – ICSPI hosts a delegation of distinguished nanoscience researchers visiting the Waterloo Institute of Nanotechnology
ICSPI Hosts Leading Nanoscience Researchers Read More »
