Redux AFM

A game-changing, automated atomic force microscope.

Introducing the Redux AFM

Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux atomic force microscope. Collect quantitative data in minutes for topography, roughness, film thickness, particle size and more.

Effortless nanoscale imaging

Powerful

Quantitative 3D data with sub-nanometer precision

Fast

Go from sample loading to data in minutes

Automated

One-click configuration and no laser alignment

Versatile

Topography, roughness, thickness, particle size and more

The nGauge AFM

Nanoscale imaging for everyone.

nGauge atomic force microscope set up on a benchtop

One technique. Many solutions.

Make better decisions — faster — with quantitative 3D nanoscale data.

Collect rich, quantitative data in 3D with high resolution.

Go beyond line profiles and Ra: get quantitative data across an area in 3D.

Accurately measure film thickness and step heights.

Determine particle size, shape and distribution.

Discover the spatial distribution of components in your materials.

Effortless nanoscale imaging on any benchtop

See how the nGauge AFM is used to make nanoscale discoveries 
on the material science channel
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Trusted by scientists, engineers and educators worldwide

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atomic force microscopy?

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