Vertex AFM

VERTEX AFM

Infinite Sample AFM

The Vertex AFM enables non-destructive nanoscale metrology of ultra-large samples.

The Vertex AFM fits the sample you need to measure, removing the need for invasive sample extraction procedures.

Infinite sample size
Wireless*
Portable

The Vertex AFM is able to be flexibly deployed wherever 3D nanoscale data is required.

whether it be an aircraft wing, oil pipeline or nuclear reactor, all without leaving a scratch

Battery operated*
Field applications
Remote operation

The Vertex AFM can be used wherever you need it.

in the field, production line or laboratory.

Process control
Nanoscale resolution 3D metrology
Fast scans

Learn more about the Vertex AFM

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