Vertex AFM
The Vertex AFM enables non-destructive nanoscale metrology of ultra-large samples.
The Vertex AFM fits the sample you need to measure, removing the need for invasive sample extraction procedures.
Infinite sample size
Wireless*
Portable
The Vertex AFM is able to be flexibly deployed wherever 3D nanoscale data is required.
whether it be an aircraft wing, oil pipeline or nuclear reactor, all without leaving a scratch
Battery operated*
Field applications
Remote operation
The Vertex AFM can be used wherever you need it.
in the field, production line or laboratory.