nGauge Atomic Force Microscope
The nGauge AFM is the world’s only truly benchtop atomic force microscope (AFM). Produce high-quality topography images down to the nanoscale in seconds on virtually any surface—no vibration isolation table required.
The nGauge AFM unit includes the stage, electronics, AFM chips, electronic copy of the manual and training videos, and accessories in a compact carrying case.
Key Benefits and Features
Because of its small size, the nGauge AFM rejects building vibrations so it can be used on normal tables without vibration isolation. The nGauge only needs access to regular power and USB.
FULLY AUTOMATED, LASERLESS APPROACH
There is no laser alignment and the approach to the sample is fully automated, making set-up and training quick and simple.
Each nGauge AFM chip has fresh scanners and sensors, so you don’t have to worry about replacing expensive parts over time. Even better is that you can keep up to date with our latest technology simply by changing the chip!
The entire unit, including carrying case, weighs 1.5 kg—making the nGauge suitable for the classroom, cleanroom, glovebox or virtually anywhere else.
LARGE AND MODULAR SAMPLE STAGE
The nGauge can accommodate wide samples (up to 100 mm x 50 mm / 4” x 2”) and tall samples (up to 16 mm / 5/8”). The sample stage is also detachable, allowing you to customize the stage to suit your needs.
EASY-TO-HANDLE PROBES AND SIMPLE EXCHANGE
nGauge AFM probes are mounted onto large printed circuit boards (PCBs) that can even be handled by hand
|Mode of operation||Tapping mode, phase mode|
|Max Scan Area||20 µm × 20 µm|
|Min Scan Area||1 µm × 1 µm|
|Max Line Scan||60 µm|
|Scan speed||0.15 seconds per line||XY scanner resolution||<0.5 nm|
|Z Scanner range (Rz)||10 µm|
|Noise floor (dynamic)||<1 nm rms|
Looking for vertical resolution? The vertical noise floor is maximum 1 nm rms, meaning that features shorter than 1 nm cannot be resolved.
Sample dimensions and weight
|Sample stage area||70 mm × 42 mm|
|Z stage travel||20 mm|
|Maximum sample size*||100 mm × 50 mm × 16 mm L×W×H|
|Maximum sample weight||1 kg|
|Unit dimensions and weight|
|Unit dimensions (L×W×H)||70 mm × 90 mm × 75 mm|
|Unit weight||450 g|
|Total weight (with carrying case)||1.5 kg|
|Power Supply||7.5 VDC|
Vertical topography range
10 nm* to 10 µm (0.39* to 394 microinches (µin))
Surface roughness range
10 nm to 4 µm (0.39 to 157 microinches (µin))
1 µm = 39.37 microinch µin
1 nm = 0.03937 µin
1 µin = 1 millionth of an inch