nGauge Atomic Force Microscope

The nGauge AFM is the world’s only truly benchtop atomic force microscope (AFM). Produce high-quality topography images down to the nanoscale in seconds on virtually any surface—no vibration isolation table required.

The nGauge AFM unit includes the stage, electronics, AFM chips, electronic copy of the manual and training videos, and accessories in a compact carrying case.

Stage.jpg

Key Benefits and Features

UNMATCHED PORTABILITY

Because of its small size, the nGauge AFM rejects building vibrations so it can be used on normal tables without vibration isolation. The nGauge only needs access to regular power and USB.

FULLY AUTOMATED, LASERLESS APPROACH

There is no laser alignment and the approach to the sample is fully automated, making set-up and training quick and simple.

MODULAR CHIPS

Each nGauge AFM chip has fresh scanners and sensors, so you don’t have to worry about replacing expensive parts over time. Even better is that you can keep up to date with our latest technology simply by changing the chip!

UNMATCHED VERSATILITY

The entire unit, including carrying case, weighs 1.5 kg—making the nGauge suitable for the classroom, cleanroom, glovebox or virtually anywhere else.

LARGE AND MODULAR SAMPLE STAGE

The nGauge can accommodate wide samples (up to 100 mm x 50 mm / 4” x 2”) and tall samples (up to 16 mm / 5/8”). The sample stage is also detachable, allowing you to customize the stage to suit your needs.

EASY-TO-HANDLE PROBES AND SIMPLE EXCHANGE

nGauge AFM probes are mounted onto large printed circuit boards (PCBs) that can even be handled by hand

Technical Specifications

 

AFM Specifications


 
Mode of operation Tapping mode, phase mode
Operation environment Ambient
 
Lateral Scanning
Max Scan Area 20 µm × 20 µm
Min Scan Area 1 µm × 1 µm
Max Line Scan 60 µm
Scan speed 0.15 seconds per line
XY scanner resolution <0.5 nm
 
Vertical scanning
Z Scanner range (Rz) 10 µm
Noise floor (dynamic) <1 nm rms

Looking for vertical resolution? The vertical noise floor is maximum 1 nm rms, meaning that features shorter than 1 nm cannot be resolved.

 

nGauge AFM scan range. Area scan is 20 µm x 20 µm. Linear scan is 60 µm.

 
 

Sample dimensions and weight


Environment Dry
Sample stage area 70 mm × 42 mm
Z stage travel 20 mm
Maximum sample size* 100 mm × 50 mm × 16 mm L×W×H
Maximum sample weight 1 kg
 
 
 

Hardware specifications

Unit dimensions and weight
Unit dimensions (L×W×H) 70 mm × 90 mm × 75 mm
Unit weight 450 g
Total weight (with carrying case) 1.5 kg
 
Connections
Communication USB
Power Supply 7.5 VDC
 

Vertical topography range

10 nm* to 10 µm (0.39* to 394 microinches (µin))

Surface roughness range

10 nm to 4 µm (0.39 to 157 microinches (µin))

Conversions

1 µm = 39.37 microinch µin

1 nm = 0.03937 µin

1 µin = 1 millionth of an inch

 

Brochure

 

Technical Drawings