Introducing the Redux AFM
Effortlessly collect images with sub-nanometer precision on your benchtop with the Redux atomic force microscope. Navigate to the region of interest with the motorized XY stage and collect quantitative 3D data in minutes for topography, roughness, film thickness, particle size and more.
Effortless nanoscale imaging
Powerful
Quantitative 3D data with sub-nanometer precision
Fast
Go from sample loading to data in minutes
Automated
One-click configuration and no laser alignment
Versatile
Topography, roughness, thickness, particle size and more
One technique. Many solutions.
Make better decisions — faster — with quantitative 3D nanoscale data.
Collect rich, high- resolution images with topographic data.
Go beyond line profiles and Ra: get quantitative data across an area in 3D.
Accurately measure film thickness and step heights.
Determine particle size, shape and distribution.
Non-destructively discover the spatial distribution of components in your materials.
Effortless nanoscale imaging on any benchtop
on the material science channel Breaking Taps