Specifications

AFM

Max Scan Area 20 × 20 µm
Min Scan Area 1 × 1 µm
Max Line Scan 60 µm
Z Scanner Range 10 µm
Scan Speed 0.15 seconds per line
Resonant Frequency 9 kHz
Mode of Operation Tapping Mode
Vertical resolution (dynamic RMS noise) <1 nm
Tip Radius <80 nm

Unit

System Dimensions 70 × 90 × 75 mm L×W×H
Sample Stage Area 70 × 42 mm
Normal max. sample size 100 mm × 50 mm × 16 mm L×W×H
Z Stage Travel 20 mm
System Weight 450 g
OS Requirements Windows, OS X
Communication USB
Power Supply 7.5 VDC

Vertical topography range

10 nm* to 10 µm (0.39* to 394 microinches (µin))

*: RMS noise floor is 1 nm, meaning that 10 nm is the minimum step height with reasonable accuracy

Surface roughness range

10 nm to 4 µm (0.39 to 157 microinches (µin))

Conversions

1 µm = 39.37 microinch µin

1 nm = 0.03937 µin

1 µin = 1 millionth of an inch

 

Brochure

 

Technical Drawings

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