nGauge AFM

The affordable AFM that anyone can use

nGauge atomic force microscope set up on a benchtop

nGauge AFM

The nGauge AFM is the world’s first atomic force microscope (AFM) powered by AFM-on-a-chip technology. Effortlessly collect 3D images at the nanoscale on your own benchtop in just three clicks.

 

3D nanoscale images in 3 clicks

Five-minute set-up

Time lapse of AFM scans on an Intel microchip (copper and silicon dioxide). The number indicates scan number. Watch how image quality (lateral resolution) does not degrade after 1000+ scans.

Ultra-durable chips capable of thousands of scans

Specifications

AFM Specifications
Max scan area (XY)20 μm x 20 μm
Z Range10 μm
Scan speed80 seconds (256 x 256 pixel, 20 μm x 20 μm)
Noise floor<0.5 nm rms
XY Scanner resolution<0.5 nm
ImagesTopography, Phase, Error
ApproachAutomatic
Sample
Max sample size100 mm x 50 mm x 18 mm
System Dimensions
Dimensions (L x W x H)9 cm x 7 cm x 7.5 cm
Weight450 g
Software and I/O
CommunicationUSB
Operating SystemWindows 10, 11
Power
Power supplyClass II (two prong)
Input100-240 VAC ~ 50/60 Hz
Output7.5 VDC, 1.6 A

Frequently Asked Questions

Both the Redux and nGauge systems use our AFM-on-a-chip technology to make nanoscale imaging effortless.

The Redux has a higher level of automation, combining an integrated optical microscope and motorized XY stage controls, and it also has a sample platform that can accommodate larger samples.

Compare the specs here!

Our AFM chips are made with state-of-the-art microelectromechanical systems-based (MEMS) technology that make our systems fast, easy-to-use and work like magic. Each chip features an integrated, laser alignment-free sensor, precise XYZ scanners, and cantilever with tip for imaging.

You can read more about the chips on our page!

Nope! With our AFM-on-a-chip technology, the legacy AFM requirement of time-consuming laser alignment is done away with.

Yes! Our AFM-on-a-chip technology is interchangeable between our products.

For most samples, yes! There is very little sample preparation required for most samples. Transparent or opaque, conductive or non-conductive, adhesive or not, they can all be scanned. Scanning curved samples is no issue as well since any curvature usually does not show up on the micron length scale.

It’s important that the sample does not move during scanning. For lightweight samples like foils, paper, and for flexible or round samples that could roll (wire, hair), we recommend affixing them to a substrate (glass slide, mica disc) or a simple jig.

Yes! Refer to the question above this one.

Generally yes! The reason is that even if the morphology across the sample shows high variation, within the lateral scan area it will typically never reach those levels.

The nGauge sample stage is motorized in the Z direction and manually controlled using adjustment knobs in the XY directions.

Each AFM chip lasts more than 50x the lifetime of traditional AFM probes and can be used for thousands of scans.

Check out this time lapse video of scans taken using our technology as a showcase. 

Generally no but it also depends on your specific resolution requirements and operating environment.

The nGauge does not currently support scanning liquid samples.

Yes! Please refer to our Roughness capabilities page for more information.

The nGauge operates in intermittent contact mode and collects topography and phase images.

The nGauge does not currently provide force-distance curves.

Yes! Refer to our product specifications for sizing.

The nGauge does not currently support in-vacuum operation and is meant for operation in ambient conditions.

Ready to start scanning on your benchtop?

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