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McGill Introduction to AFM Workshop (Afternoon Session)

  • Ruttan Room (Room 321) Otto Maass Chemistry Building, McGill University (map)

Link to flyer

Link to register

Atomic force microscopy (AFM) is one of the most widely used techniques for measurement at the nanoscale. AFM uses a very small probe tip that scans across and physically ‘feels’ the surface of a sample, kind of like a record player. The interaction between the tip and the surface is measured, which means that unlike optical or electron microscopy AFM generates a 3-dimensional reconstruction of the surface. Typical applications include:

  • Topography (line profile)

  • Surface roughness

  • Particle counting

  • Phase imaging

  • Grain size

In this brief workshop on atomic force microscopy you will learn about:

  • The principle of operation of AFM

  • Single-chip AFMs and how they work

  • How to operate an nGauge AFM (live demonstration)

  • Processing AFM images in open source software (Gwyddion)

  • How to use AFM in your R&D

Questions? Get in touch with David Morris, Director of Operations at ICSPI, at david@icspicorp.com