Back to All Events

Concordia Introduction to AFM Workshop

  • Seminar Room (SP-157) Science Pavillion, Concordia University (map)
icspi_flyer_header

Atomic force microscopy (AFM) is one of the most widely used techniques for measurement at the nanoscale. AFM uses a very small probe tip that scans across and physically ‘feels’ the surface of a sample, kind of like a record player. The interaction between the tip and the surface is measured, which means that unlike optical or electron microscopy AFM generates a 3-dimensional reconstruction of the surface. Typical applications include:

  • Topography (line profile)

  • Surface roughness

  • Particle counting

  • Phase imaging

  • Grain size

In this brief workshop on atomic force microscopy you will learn about:

  • The principle of operation of AFM

  • Single-chip AFMs and how they work

  • How to operate an nGauge AFM (live demonstration)

  • Processing AFM images in open source software (Gwyddion)

  • How to use AFM in your R&D

Questions? Get in touch with David Morris, Director of Operations at ICSPI, at david@icspicorp.com